31-12-2015, 09:24 PM
I'm not familiar with the 2N706, but the early silicon transistors did have a failure mode not related to dissipation, SOAR or the like. I killed a load of BCZ11 transistor's in a switching circuit that I'd built for a school intercom project because I had allowed the b.e junction to draw a pulse of current through a small speed up capacitor. "Newer" devices seem to zener it away successfully. It left the devices totally o/c. In the original post on this topic I mentioned the "tin creep" that shorted the TO18 packages across the base. I've just been informed this phenomena is called dendrites (?) And have been given a link to a NASA who are constructing a web page devoted to explaining the difference between this and tin whiskers. http://nepp.nasa.gov/whisker/dendrite/ . Its amazing how something so small can cause thousands of pounds worth of down time for industry time and again just because an accountant didn't see a bit of varnish as being necessary! Andy.